Showing results: 16 - 30 of 82 items found.
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FISCHERSCOPE X-RAY/XDAL -
Helmut Fischer AG
With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings due to better signal/noise ratiosMicro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.Large and spacious measurement chamber with a cutout(C-slot)Fast, programmable XY-stage with pop-out function
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FISCHERSCOPE X-RAY/XAN 250 -
Helmut Fischer AG
Universal premium instrument with comprehensive measurement capabilitiesAperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeableWith high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elementsMeasuring direction from bottom to top, this allows for quick and easy sample positioning
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FISCHERSCOPE XDL -
Helmut Fischer AG
Robust instrument suited for coating thickness measurements, even at large measuring distances (DCM, stroke 0-80 mm)Features a fixed aperture and a fixed filterSuitable for structure sizes starting at about 1 mmLarge and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is availableStandard X-ray tube, proportional counter tube
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FISCHERSCOPE X-RAY/XDLM -
Helmut Fischer AG
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filtersSuitable for smaller structures such as connector contacts or printed circuit boardsLarger measuring distances are possible as well (DCM, stroke 0-80 mm)Large and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is available
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JEOL Ltd.
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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K581 -
Chongqing Kailian Yongrun Industrial Co.,Ltd.
It is designed to test mass(%) of total sulfur in crude petroleum, petroleum, heavy oil, diesel oil, gasoline and naphtha; to test total sulfur content in products of coal chemical industry, for instance primary benzene; to test total sulfur or sulfide in other liquids or solid power samples.Conforms to ASTM D4294, GB/T 17040 and GB/T 11140.
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X-Supreme8000 -
Oxford Instruments plc
XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
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Bruker Optics
Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.
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Bruker AXS GmbH
Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.
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Vanta -
Olympus Corp.
The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership. With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high throughput and a fast return on investment. Featuring innovative and proprietary Axon technology, Vanta analyzers give you accurate results and help boost productivity no matter the environment or working conditions.
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Epsilon Range -
Malvern Panalytical Ltd
The Epsilon range of X-ray fluorescence XRF analyzers are an ideal analytical solution. They are capable of simple element identification and quantification up to more sophisticated analysis. They are easy to operate, compact and X-ray safe instruments without the need for additional chemicals or operating gasses. Considerable savings in time and cost are two of the many benefits XRF can bring compared to alternative analytical techniques.
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Bruker Nano Surfaces
Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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Bruker Nano Surfaces
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Rigaku Corp.
Total Reflection X-Ray Fluorescence (TXRF) Products by Rigaku
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ZSX Primus IV -
Rigaku Corp.
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.